A STUDY OF PASSIVE FILM ON REBAR SURFACE BY ATOMIC FORCE MICROSCOPE

J Chin Soc Corr Pro

1998, Vol. 18

Issue (2): 102-106 DOI:

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A STUDY OF PASSIVE FILM ON REBAR SURFACE BY ATOMIC FORCE MICROSCOPE

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Abstract Atomic force microscope(AFM) was used to study passive film on the rebar surface in a simulated concrete pore solution. AFM is a powerful tool for studying the microstructure and surface topography of passive film. The results revealed that no matter whether Cl- was present or not, there was always defects in the passive film on rebar. They might lie at the dislocations and dissoluble impurites.The maximum size of the defects was up to 10μm. The results also showed that these defects could be improved or even eliminated by adding composite inhibitors so that the resistance of pitting corrosion would be enhanced.

Key words: Atomic force microscope(AFM) Rebar Passive film Pitting Composite inhibitor

Received: 25 April 1998

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WANG Ying SHI Yuan-xiang WEI Bao-ming (Nanjing University of Chemical Technology; Department of Applied Chemistry; Nanjing 210009)LIN Chang-jian (Xiamen University; Department of Chemistry; Xiamen 361005). A STUDY OF PASSIVE FILM ON REBAR SURFACE BY ATOMIC FORCE MICROSCOPE. J Chin Soc Corr Pro, 1998, 18(2): 102-106.

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https://www.jcscp.org/EN/ OR https://www.jcscp.org/EN/Y1998/V18/I2/102

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