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| A PHOTOELECTROCHEMICAL STUDY OF PITTING AND USE OF INHIBITOR PC-6O4 ON ISON IN BORATE BUFFER SOLUTION |
| YANG Maizhi; CHEN Li; CAI Shengmin (Department of Chemistry; Beijing University; Beijing 100871) |
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Abstract The photoelectrochemical behavior of iron and its susceptibility to pitting in a borate buffer solution ofpH8.4 were studied in the presence and absence of inhibitor PC-604. The aim of this work was to analyze the relationship between character of passivation film and pitting on iron. Pure iron was anodically passivated in the solution for different durations in the presence and absence of the inhibitor, then Cl- was added in, and the change of dark current Id and photocurrent IPh with time was observed. When passivation time passed 24h or the quantity of the inhibitor exceeded 20ppm, pitting could not be initiated.The Eg of the passive film on iron was measured at different inhibitor concentrations and passivatinn durations.Results implied that the Eg data did not vary apparently.But the photocurrent increased with increasing passivation time or inhibitor concentration. It meant the inhibitor did not interfere with the energy level structure of the sc miconductor-passivation film.From transient photocurrent image t he so-called film parameter of passivation film was deterndnd. It was found that at a given passivation time, the film parameter increased with increasing quantity of inhibitor,and at a given concentration of inhibitor,the film parameter increased with increasing passivation time too. It was significant that the role of this inhibitor was to promote efficient passivation. The film parameter was related to the thickness and the compactness of the passive film.
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Received: 25 August 1996
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Cite this article:
YANG Maizhi; CHEN Li; CAI Shengmin (Department of Chemistry; Beijing University; Beijing 100871). A PHOTOELECTROCHEMICAL STUDY OF PITTING AND USE OF INHIBITOR PC-6O4 ON ISON IN BORATE BUFFER SOLUTION. J Chin Soc Corr Pro, 1996, 16(4): 269-274.
URL:
https://www.jcscp.org/EN/ OR https://www.jcscp.org/EN/Y1996/V16/I4/269
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