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| Comparison of Passive Films on X100 and X80 Pipeline Steels in NaHCO3 Solution |
| ZHAO Yang, LIANG Ping, SHI Yanhua, WANG Bingxin, LIU Feng, WU Zhanwen |
| School of Mechanical Engineering, Liaoning Shihua University, Fushun 113001, China |
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Abstract The polarization behavior of X100 and X80 pipeline steel in 0.5 mol/L NaHCO3 solution were analyzed by potentiodynamic polarization, and the growth mechanism and semiconductor properties of both passive films were investigated using current density versus time curves and Mott-Schottky measurement, and the density and diffusion coefficient of point defect in passive films were calculated by means of capacitance measurement and point defect model (PDM). The results showed that the growth process of the two passive films formed on pipeline steels was controlled by electromigration and dissolution-deposition process, and the conductive characteristics of the two passive films belonged on n-type semiconductor. However, in comparison with X80 steel, X100 steel exhibited lower corrosion current density and passive current density, but a higher pitting breakthrough potential. The passive film on X100 steel had a lower donor density and point defect diffusion coefficient. Therefore, X100 steel displayed a better general corrosion and pitting corrosion resistance than X80 steel.
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Received: 07 July 2013
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