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表面膜椭圆法理论曲线的计算 |
邱富荣;刘执平;丁雪娣 |
中国科学院福建物质结构研究所;中国科学院福建物质结构研究所;中国科学院福建物质结构研究所 |
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COMPUTATION OF ELLIPSOMETRIC THEORETICAL CURVES OF SURFACE FILMS |
Qiu Furong Liu Zhiping and Ding Xuedi(Fujien Materials Structure Research Institute; Academia Sinica) |
[1] W. E. J. Neal, Optical examination and monitoring of surfaces, Application of Surface Science, 2, 4, 445(1979) [2] D. T. Larson, Surface analytic technigues in corrosion science, Corrosion Science, 19, 10, 657(1979) [3] F. L. McCrackin and J. Colson, A FORTRAN program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films, NBS Tech. Note 242 (1964) [4] F. L. McCrackin, A FORTRAN program for analysis of ellipsometer measurements, Tech, Note 479, NBS, Wasington D.C(1969) [5] 一机部自动化所,单层介质列线图,1981年椭园测量学术会议资料 [6] 西安交通大学,椭园度仪测量硅片上薄膜厚度及折射率(1974) [7] 母国光、战元令编,光学(1979) [8] 重庆大学物理化学教研室,椭园法在金属腐蚀研究中的应用(1979) [9] G. M. Bulman and A. C. C. Tseung, An ellipsometric study of passive film growth on stainless steel, Corrosion Science, 13, 7, 531 (1973) [10] Z.Szklarska-Smialowska and N. Lukomski, Ellipsometric Study of Surface Films Grown on Austenitic Stainless Steel in Chloride Solution, Corrosion, 34, 5, 117 (1978) [11] 邱富荣、史礼义,椭圆偏光法研究低碳钢在碳铵溶液中的阳极钝化行为(1980) [12] Level Ⅱ BASIC Reference Mannal, Radio Shack, a division of Tandy Corporation (1980) |
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