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A XPS STUDY OF REBAR PASSIVE FILM AND EFFECT OF CHLORIDE IONS ON IT |
WANG Ying SHI Yuan-xiang WEI Bao-ming(Nanjing University of Chemical Technology; Department of Applied Chemistry; Nanjing 210009)LIN Chang-jian (Xiamen University; Department of Chemistry; Xiamen 361005) |
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Abstract The composition and structure of rebar passive film as well as the effect of composite inhibitors and chloride ions on the film were studied by X-ray photoelectron spectroscopy. It was found that γ- FeOOH was the major oxide in the outer layer and the inner layer only contained FeO. The machanism of pitting corrosion induced by Cl- might be as follows. First, chloride ions adsorbed on rebar passive film, then they penetrated into the film through defects and accumulated in the inner layer of the film. Cl- and Fe2+ might form into FeCl2, so the passive film dissolved from its inner layer locally. After adding composite inhibitors, γ-FeOOH content in the outer layer increased and organic ammonium incorporated in the film to certain depth, and silicate only deposited on the surface of the film.
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Received: 25 April 1998
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Cite this article:
WANG Ying SHI Yuan-xiang WEI Bao-ming(Nanjing University of Chemical Technology; Department of Applied Chemistry; Nanjing 210009)LIN Chang-jian (Xiamen University; Department of Chemistry; Xiamen 361005). A XPS STUDY OF REBAR PASSIVE FILM AND EFFECT OF CHLORIDE IONS ON IT. J Chin Soc Corr Pro, 1998, 18(2): 107-112.
URL:
https://www.jcscp.org/EN/ OR https://www.jcscp.org/EN/Y1998/V18/I2/107
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