对单面氧化弯曲法计算氧化膜应力公式的修正

中国腐蚀与防护学报

1992, Vol. 12

Issue (1): 90-94

研究报告

本期目录 | 过刊浏览

对单面氧化弯曲法计算氧化膜应力公式的修正

李美栓;李铁藩

中国科学院金属腐蚀与防护研究所腐蚀科学开放实验室;中国科学院金属腐蚀与防护研究所腐蚀科学开放实验室

MODIFICATION OF STONEY'S FORMULA USED TO CALCULATE THE OXIDE SCALE STRESS IN THE SINGLE-FACE OXIDATION INDUCED BENDING TEST

Li. Meishuan and. Li Tie fan (Corrosion Science Laboratory; Institute of Corrosion and Protection of Metals ;Academia Sinica)

全文: PDF(365 KB)

摘要: <正> 一、引言早在二十年代,人们就发现伴随金属表面氧化膜的形成,膜内同时产生应力。氧化膜应力对膜的抗剥落性能的影响是近年来高温氧化领域一个引人注目的研究课题。目前,对于氧化膜应力可以进行定量测量,测量方法主要有单面氧化弯曲法和X-光衍射法。其中因单面氧化弯曲法较简单并能进行原位连续测试而应用较为广泛。并且,用此法还能测量由电镀、离子镀和气相沉积等技术制备的表面涂层的内应力。但是,单面氧化弯曲法也存在某些不足之处。条状试样须单面镀保护膜,受此影响,初始氧化膜生长应力的测量误差就可能较大。特别是,单面氧化弯曲法是采用stoney公式进行应

Abstract：If the product of Young's modulus of the oxide scale and its thickness can not be neglected as compared with that of the same two factors for substrate ,the stress released due to bending of specimen is high ,so the measured stress is different from the real stress in the oxide scale on non-bending substrate. And if the solubility of oxygen is high in substrate,the gradient of oxygen concentration will result in tensile stress in oxide scale. However, the direction of stress and that of bending are not identical. Under these conditions, the generally used stoney's formula for calculating the stress of oxide scale in the single-face oxidation induced bending test must be modified. The analysis is significant for further study of the oxide stress.

收稿日期: 1992-02-25

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引用本文:

李美栓;李铁藩. 对单面氧化弯曲法计算氧化膜应力公式的修正[J]. 中国腐蚀与防护学报, 1992, 12(1): 90-94.
. MODIFICATION OF STONEY'S FORMULA USED TO CALCULATE THE OXIDE SCALE STRESS IN THE SINGLE-FACE OXIDATION INDUCED BENDING TEST. J Chin Soc Corr Pro, 1992, 12(1): 90-94.

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https://www.jcscp.org/CN/ 或 https://www.jcscp.org/CN/Y1992/V12/I1/90

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