FeCr15Ni15单晶600 ℃下热生长氧化膜的TEM观察
魏欣欣1,2,张波1(
),马秀良1
),马秀良1
TEM Investigation to Oxide Scale Formed on Single Crystal Alloy FeCr15Ni15 at High Temperature
WEI Xinxin1,2,ZHANG Bo1(),MA Xiuliang1
),MA Xiuliang1
图5. 氧化膜内层区域I的HAADF-STEM高分辨像
Fig.5. High resolution HAADF-STEM image along [110] axis of the inner area I of the oxide scale in Fig.1 and the oxidation proceeds along a series of {111} close packed planes (a), the FFT diffractogram image of the selected area (b) and twin defects in the oxide scale (c)
