Object | Method | Information |
---|
Composition | FIB/SIMS[16,17,18,19,25,28] | The composition at micro area adjacent to inclusions accurately | Crystal structure, composition, morphology | TEM[17,18,19,26,27,28,29,38,53,57,60,61,62] | The composition accurately and quantitatively in nano area | Composition | AES[21,63] | The composition accurately in microscale area | Morphology, composition | SEM[21,25,28,32,33,38,53,58,60,61,62,64] | In situ observation of corrosion morphology | Current distribution, Composition | SECM[63] | Surface information and local Ferrari current map of materials | Composition | EPMA[32,33,57] | The trace amount | Depth of pits | AFM[53,63] | The depth of pits | The corrosion behavior of single inclusion | Microscale potentiodynamic polarization[25,53] | Pitting potential, corrosion current density | The corrosion behavior of specimen or inclusion | Macroscale potentiodynamic polarization[25,32] | Pitting potential, corrosion current density | The metastable pitting of inclusions | Potentiostatic polarization[32] | The number of metastable pitting | The morphology of grain/grain boundaries or inclusion | Immersion tests[21] | Corrosion morphology of grain/grain boundaries or inclusions | The degree of sensitization (DOS) | DLEPR[33,61,64] | Ir/Ia<2%, no; 2~8%, little; 8~30%, weak and medium; >30%, severe | The corrosion resistance of specimen | OCP[61] | Variation of open-circuit voltage with time |
|