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J Chin Soc Corr Pro  1986, Vol. 6 Issue (4): 255-263    DOI:
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AN ELLIPSOMETRIC STUDY OF PASSIVE FILMS FORMED ON DUPLEX STAINLESS STEEL IN CHLORIDE SOLUTION
Zhou Qingchu Xu Naixin and Shih Shengtai(Shanghai Institute of Metallurgy; Academia Sinica)
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Abstract  Passive films formed on duplex stainless steel 05Cr20Ni 9Mo4Cu2Si 3N in 3. 5% NaCl solution have been studied by ellipsometry combined with AC impedance measurements. It was found that all passive films formed at open-circuit potential and at various anodic potentials(+0. 2 and+ 0. 6V, vs. Ag/AgCl) have a two layer structure, while their growth mechanisms are different. At open-circuit potential the inner absorbing film with a refractive index of ca. 2. 5 is predominantly composed of Fe_2O_3 and Cr_2O_3. At constant potentials inner layer films are adsorbed-films with a refractive index ofea. 1. 2. Under both conditions the outer layer films with arefraetive index of ca. 1. 7 are predominantly composed of FeOOH, CrOOH or Cr(OH)_3 and have amorphous structure possibly. The kinetics of both inner and outer layer film growth at constant potentials follows logarithmic law. The kinetics of the inner layer film growth at open-circuit potential is approximately logarithmic.
Received:  25 August 1986     
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Zhou Qingchu Xu Naixin and Shih Shengtai(Shanghai Institute of Metallurgy; Academia Sinica). AN ELLIPSOMETRIC STUDY OF PASSIVE FILMS FORMED ON DUPLEX STAINLESS STEEL IN CHLORIDE SOLUTION. J Chin Soc Corr Pro, 1986, 6(4): 255-263.

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