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J Chin Soc Corr Pro  1987, Vol. 7 Issue (4): 281-285    DOI:
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REVEALATION OF DEFECTS IN InP BY CHEMICAL ETCHING METHOD
Zhao Zhe (Shanghai University of Engineering and Technology) Shen Baoliang (Shanghai Institute of Metallurgy Academia Siniea)
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Abstract  Six chemical etchants have been selected for reveating the defects in InP crystals. The choice of etchant composition and the optimum etching temperature for each etehant is based on experimental results for obtaining the dislocation patterns with clear etched pits. Finally, an etchant of (H_3PO_4+HBr)has been found which successfully reveals dislocations in VPE InP.
Received:  25 August 1987     
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Zhao Zhe (Shanghai University of Engineering and Technology) Shen Baoliang (Shanghai Institute of Metallurgy Academia Siniea). REVEALATION OF DEFECTS IN InP BY CHEMICAL ETCHING METHOD. J Chin Soc Corr Pro, 1987, 7(4): 281-285.

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https://www.jcscp.org/EN/     OR     https://www.jcscp.org/EN/Y1987/V7/I4/281

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