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J Chin Soc Corr Pro  1990, Vol. 10 Issue (4): 287-296    DOI:
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AN ELLIPSOMETRIC STUDY OF PASSIVE FILMS FORMED ON NICKEL IN BORIC ACID-BORAX SOLUTION
Zhou Oingchu Xu Naixin Shih Shengtai (Shanghai Institute of Metallurgy;Academia Sinica)
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Abstract  Passive films formed on nickel in boric acld-borax solution at first passive potential(-0.5,vs.SCE),steady passive potential(0.4V,vs. SCE)and passive-transpassive potential(0.8V,vs.SCE)have been stu- died by ellipsometry.The results show that the thickness,kinetics, composition and mechanism of passive films are dependent upon applied potential;at above mentioned potentials,the passive films have a two- layer structure,in which the inner layer of the film grows subsequently from the outer layer of the film inwards;the growth of all inner layers follows a linear dependence on time whilst the kinetics of outer layers at-0.5,0.4 and 0,8 V is linear,parabolic and logarithmic respectively. At constant potential-0.5V,the thickness and composition of inner and outer layers are 223 ,β-Ni(OH)_2and 69,NiO·xH_2O;at 0.4 V,88 ,α-Ni(OH)_2and 33 ,NiO·xH_2O;and at 0,8V,254 ,γ_2-NiOOH and 304 ,β-NiOOH,respectively.
Received:  25 August 1990     
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Zhou Oingchu Xu Naixin Shih Shengtai (Shanghai Institute of Metallurgy;Academia Sinica). AN ELLIPSOMETRIC STUDY OF PASSIVE FILMS FORMED ON NICKEL IN BORIC ACID-BORAX SOLUTION. J Chin Soc Corr Pro, 1990, 10(4): 287-296.

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https://www.jcscp.org/EN/     OR     https://www.jcscp.org/EN/Y1990/V10/I4/287

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