Effect of Sodium Silicate Sealing on Corrosion Resistance of TiO2Conversion Film on Hot-dip Galvanized

doi:10.11902/1005.4537.2017.199

Journal of Chinese Society for Corrosion and protection

2018, Vol. 38

Issue (6): 607-614 DOI: 10.11902/1005.4537.2017.199

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Effect of Sodium Silicate Sealing on Corrosion Resistance of TiO₂Conversion Film on Hot-dip Galvanized

Delin LAI,Gang KONG(

),Chunshan CHE

1. Material Science and Engineering, South China University of Technology, Guangzhou 510640, China

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Abstract

TiO₂conversion film was prepared on the surface of hot-dip galvanized (HDG) carbon steel Q235 in Ti(SO₄)₂solution with hydrogen peroxide H₂O₂as chelating agent. Then the prepared TiO₂conversion film was further sealed via immersion in sodium silicate solution. The effect of conversion treatment time on the morphology and corrosion resistance of the TiO₂conversion film was studied. While the morphology, composition and corrosion resistance of the sodium silicate sealed TiO₂conversion film were characterized by means of SEM with EDS, XRD, XPS and electrochemical measurements. The results show that the conversion film consists of a large amount of TiO₂nanospheres, which formed on surface of the HDG steel after a short-time immersion, and then with the increasing immersion time, the nanospheres are gradually covered by reaction product ZnO/Zn(OH)₂and crack appears on the conversion film, correspondingly the corrosion resistance of the HDG steel first increases and then decreases. A complete and dense TiO₂conversion film shows better corrosion resistance, but cracks on the film can cause pitting corrosion. After sealing treatment, a sodium silicate film may further cover the pre-formed TiO₂conversion film, however, there are a large number of cracks in micron scale on the surface of such complex film. In general, after sodium silicate sealing treatment, the corrosion resistance of the short-time formed conversion film decreases, in the contrary, the corrosion resistance of long-time formed conversion film increases.

Key words: TiO₂ NaO·SiO₂ conversion film corrosion resistance hot-dip galvanizing

Received: 22 November 2017

ZTFLH:

TG174.4

Fund: Supported by National Natural Science Foundation of China(21103053);Supported by National Natural Science Foundation of China(91023002)

Corresponding Authors: Gang KONG E-mail: konggang@scut.edu.con.

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Cite this article:

Delin LAI,Gang KONG,Chunshan CHE. Effect of Sodium Silicate Sealing on Corrosion Resistance of TiO₂Conversion Film on Hot-dip Galvanized. Journal of Chinese Society for Corrosion and protection, 2018, 38(6): 607-614.

URL:

https://www.jcscp.org/EN/10.11902/1005.4537.2017.199 OR https://www.jcscp.org/EN/Y2018/V38/I6/607

Fig.1 General XPS spectra of T60 sample (a) , and fine spectra of Zn2p (b) and Ti2p (c)

Fig.2 XRD spectra of T60 and T60-SiO₂samples (a) and the enlarged spectra (b, c)

Fig.3 Surface SEM images of the chemical conversion films formed after passivation for 10 s (a), 60 s (b), 300 s (c) and 1800 s (d)

Fig.4 EDS results of the smooth area (a) and particles (b) in Fig.3a

Fig.5 Surface SEM images of the samples after passivation for 10 s (a), 60 s (b), 300 s (c), 1800 s (d) and then sealing in NaO·SiO₂solution

Fig.6 EDS result of the marked area in Fig.5a

Fig.7 PDP curves of TiO₂conversion films formed after passivation for different time

Table 1 Fitting values of various electrochemical parameters based on PDP curves in Fig.7

Fig.8 Nyquist (a) and Bode (b) plots of TiO₂conversion films formed after passivation for different time

Fig.9 Equivalent circuit used for modeling of EIS of diff-erent conversion films

Table 2 Fitting results of EIS plots based on equivalent circuit in Fig. 9

Fig.10 PDP curves of TiO₂conversion films after sealing treatment in NaO·SiO₂solution

Table 3 Fitted result of PDP curves in Fig.10

Fig.11 Nyquist (a) and Bode (b) plots of NaO·SiO₂mod-ified TiO₂conversion films

Fig.12 Equivalent circuit used for modeling of EIS of NaO·SiO₂modified conversion films

Table 4 Fitted results of EIS plots based on equivalent circuit in Fig. 12

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